Polarized infrared reststrahlen features of wurtzite ingan thin film

Polarized infrared (IR) reflectance measurement was carried out to investigate the optical phonon modes of wurtzite structure Ino.92GaoosN thin film grown by molecular beam epitaxy· Composition dependence of IR reststrahlen features was observed. Theoretical polarized ~ reflectance spectrum was s...

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Bibliographic Details
Main Authors: Yew, P., Lee, S.C., Ng, S.S., Yoon, T.T., Haslan, A.H., Wei, L.C.
Format: Conference or Workshop Item
Language:English
Published: 2014
Subjects:
Online Access:http://eprints.um.edu.my/15939/1/0001.pdf
http://eprints.um.edu.my/15939/
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