Investigation of latch-up behaviour in 0.5 micron CMOS technology / Wan Fazldia Hanim, Suhana Sulaiman and Jamil Napiah

• Main Authors: Hanim, Wan Fazldia, Sulaiman, Suhana, Napiah, Jamil
• Format: Research Reports
• Language: English
• Published: 2005
• Subjects: Electricity; Electricity and magnetism; Electric current (General)
• Online Access: https://ir.uitm.edu.my/id/eprint/48264/1/48264.pdf; https://ir.uitm.edu.my/id/eprint/48264/

The research project investigates available latch-up test structures from MIMOS Berhad and covers current-voltage characterization of silicon-controlled rectifier behaviour of parasitic BJTs in CMOS technology. Measurement setup utilizing the structures for IV measurements are designed. A suitable m...