Novel characterization technique by using an SEM
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron...
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my.iium.irep.93932012-04-06T07:18:53Z http://irep.iium.edu.my/9393/ Novel characterization technique by using an SEM Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke TK452 Electric apparatus and materials. Electric circuits. Electric networks Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment. 2008 Conference or Workshop Item REM application/pdf en http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf Sutjipto, Agus Geter Edy and -, Jufriadi and Muhida, Riza and Takata, Masasuke (2008) Novel characterization technique by using an SEM. In: XXIII-rd Int. Symp. on Discharges and Electrical Insulation in Vacuum (ISDEIV 2008), 15 - 19 September 2008, Bucharest, Romania. |
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TK452 Electric apparatus and materials. Electric circuits. Electric networks Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke Novel characterization technique by using an SEM |
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Charging and discharging phenomenon on the surface of materials can be found in plasma display panel,
spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment. |
format |
Conference or Workshop Item |
author |
Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke |
author_facet |
Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke |
author_sort |
Sutjipto, Agus Geter Edy |
title |
Novel characterization technique by using an SEM |
title_short |
Novel characterization technique by using an SEM |
title_full |
Novel characterization technique by using an SEM |
title_fullStr |
Novel characterization technique by using an SEM |
title_full_unstemmed |
Novel characterization technique by using an SEM |
title_sort |
novel characterization technique by using an sem |
publishDate |
2008 |
url |
http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf http://irep.iium.edu.my/9393/ |
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13.18916 |