The use of SEM to investigate the effect of an electron beam on the optically-visible flashover treeing of MgO ceramic
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators under electron bombardment. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an insulator surface simultaneously. The di...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer Science+Business Media
2007
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/8676/1/AGUS_-_Journal_of_Materials_Science_2007.pdf http://irep.iium.edu.my/8676/ |
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