Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

• Main Authors: Tian, G.Y., Sophian, Ali, Taylor, D., Rudlin, J.
• Format: Article
• Language: English
• Published: Institute of Electrical Engineers 2005
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://irep.iium.edu.my/47012/1/iet_Wavelet-based_PCA_defect_classification.pdf; http://irep.iium.edu.my/47012/

A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arri...