Dual EMAT and PEC non-contact probe: applications to defect testing

• Main Authors: Edwards, R.S., Sophian, Ali, Dixon, S., Tian, G.-Y., Jian, X.
• Format: Article
• Language: English
• Published: Elsevier 2006
• Subjects: TA165 Engineering instruments, meters, etc. Industrial instrumentation
• Online Access: http://irep.iium.edu.my/46714/1/Dual_EMAT_and_PEC_non-contact_probe.pdf; http://irep.iium.edu.my/46714/; http://www.sciencedirect.com/science/article/pii/S0963869505000824

For many non-destructive testing (NDT) applications, more information and greater reliability can be gained by using different techniques for defect detection, especially when the methods are particularly sensitive to different types of defects. However, this will often lead to a much longer and mor...