Mitigation of WIP-related problems at an IC production line through a suitable inspection sampling plan

• Main Authors: Karim, A.N. Mustafizul, Abd. Rahman, Mohamed, Hj. Yusop, Nornilawati
• Format: Conference or Workshop Item
• Language: English; English
• Published: 2014
• Subjects: TS Manufactures
• Online Access: http://irep.iium.edu.my/40562/1/MITIGATION_OF_WIP-RELATED_PROBLEMS.pdf; http://irep.iium.edu.my/40562/4/40562.pdf; http://irep.iium.edu.my/40562/; http://iieom.org/ieom2014/index.html

Unpredictable work-in-process (WIP) inventory developed in the inspection area of an integrated circuit (IC) assembly line due to the acceptance criteria dictated by a single sampling plan often requires additional human resources and results in longer production lead time. Sudden need of additional...