Design and modeling of silicon MEMS accelerometer
In developing Micro Electro Mechanical Systems (MEMS), Finite Element Analysis (FEA) is usually relied upon to study these micro-structures in determining stress, deformation, resonance, temperature distribution, electromagnetic interference, and electrical properties. With this kind of approach, th...
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Main Authors: | , |
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Format: | Conference or Workshop Item |
Language: | English |
Published: |
2011
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Subjects: | |
Online Access: | http://irep.iium.edu.my/2052/1/ICMAAE-11-188.pdf http://irep.iium.edu.my/2052/ |
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