صورة الغلاف

The use of scanning electron microscope in evaluating insulation property

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Sutjipto, Agus Geter Edy, Afzeri, Afzeri, Muhida, Riza, Sopyan, Iis, Haruman, Esa
التنسيق: فصل الكتاب
اللغة:English
منشور في: IIUM Press 2011
الموضوعات:
TA Engineering (General). Civil engineering (General)
الوصول للمادة أونلاين:http://irep.iium.edu.my/17609/1/Chapter_20.pdf
http://irep.iium.edu.my/17609/
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id my.iium.irep.17609
record_format dspace
spelling my.iium.irep.176092012-07-25T06:12:06Z http://irep.iium.edu.my/17609/ The use of scanning electron microscope in evaluating insulation property Sutjipto, Agus Geter Edy Afzeri, Afzeri Muhida, Riza Sopyan, Iis Haruman, Esa TA Engineering (General). Civil engineering (General) IIUM Press 2011 Book Chapter REM application/pdf en http://irep.iium.edu.my/17609/1/Chapter_20.pdf Sutjipto, Agus Geter Edy and Afzeri, Afzeri and Muhida, Riza and Sopyan, Iis and Haruman, Esa (2011) The use of scanning electron microscope in evaluating insulation property. In: Mechatronics book series: Selected papers from ICOM'01, ICOM'05 and ICOM'08. IIUM Press, Kuala Lumpur, pp. 180-186. ISBN 9789670225685
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic TA Engineering (General). Civil engineering (General)
spellingShingle TA Engineering (General). Civil engineering (General)
Sutjipto, Agus Geter Edy
Afzeri, Afzeri
Muhida, Riza
Sopyan, Iis
Haruman, Esa
The use of scanning electron microscope in evaluating insulation property
format Book Chapter
author Sutjipto, Agus Geter Edy
Afzeri, Afzeri
Muhida, Riza
Sopyan, Iis
Haruman, Esa
author_facet Sutjipto, Agus Geter Edy
Afzeri, Afzeri
Muhida, Riza
Sopyan, Iis
Haruman, Esa
author_sort Sutjipto, Agus Geter Edy
title The use of scanning electron microscope in evaluating insulation property
title_short The use of scanning electron microscope in evaluating insulation property
title_full The use of scanning electron microscope in evaluating insulation property
title_fullStr The use of scanning electron microscope in evaluating insulation property
title_full_unstemmed The use of scanning electron microscope in evaluating insulation property
title_sort use of scanning electron microscope in evaluating insulation property
publisher IIUM Press
publishDate 2011
url http://irep.iium.edu.my/17609/1/Chapter_20.pdf
http://irep.iium.edu.my/17609/
_version_ 1643607318535864320
score 13.154949

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