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Logic integrated circuit(IC) functional tester

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Bibliographic Details
Main Author: Goh, Siang Wei
Format: Final Year Project / Dissertation / Thesis
Published: 2011
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utar.edu.my/89/1/EE%2D2011%2D0706544%2D1.pdf
http://eprints.utar.edu.my/89/
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spelling my-utar-eprints.892011-09-08T07:30:28Z Logic integrated circuit(IC) functional tester Goh, Siang Wei TK Electrical engineering. Electronics Nuclear engineering 2011-05 Final Year Project / Dissertation / Thesis NonPeerReviewed application/pdf http://eprints.utar.edu.my/89/1/EE%2D2011%2D0706544%2D1.pdf Goh, Siang Wei (2011) Logic integrated circuit(IC) functional tester. Final Year Project, UTAR. http://eprints.utar.edu.my/89/
institution Universiti Tunku Abdul Rahman
building UTAR Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tunku Abdul Rahman
content_source UTAR Institutional Repository
url_provider http://eprints.utar.edu.my
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Goh, Siang Wei
Logic integrated circuit(IC) functional tester
format Final Year Project / Dissertation / Thesis
author Goh, Siang Wei
author_facet Goh, Siang Wei
author_sort Goh, Siang Wei
title Logic integrated circuit(IC) functional tester
title_short Logic integrated circuit(IC) functional tester
title_full Logic integrated circuit(IC) functional tester
title_fullStr Logic integrated circuit(IC) functional tester
title_full_unstemmed Logic integrated circuit(IC) functional tester
title_sort logic integrated circuit(ic) functional tester
publishDate 2011
url http://eprints.utar.edu.my/89/1/EE%2D2011%2D0706544%2D1.pdf
http://eprints.utar.edu.my/89/
_version_ 1646030433163411456
score 13.15806

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