Die defect detection for integrated circuit using deep learning object detection techniques
Due to advances in semiconductor technology, the complexity of integrated circuit design continues to increase, resulting in ever-smaller defects appearing on these circuits. While some companies still rely on manual inspection for defect detection, these small and hard-to-see defects often lead to...
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| Format: | Final Year Project / Dissertation / Thesis |
| Published: |
2023
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| Online Access: | http://eprints.utar.edu.my/6105/1/SE_1901610_TACK_HWA_WONG.pdf http://eprints.utar.edu.my/6105/ |
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