Pinch current limitation effect in plasma focus

The Lee model couples the electrical circuit with plasma focus dynamics, thermodynamics, and radiation. It is used to design and simulate experiments. A beam-target mechanism is incorporated, resulting in realistic neutron yield scaling with pinch current and increasing its versatility for invest...

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Main Authors: Lee, S., Saw, S. H.
Format: Article
Language:English
Published: AIP Publishing 2008
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Online Access:http://eprints.intimal.edu.my/221/1/8.pdf
http://eprints.intimal.edu.my/221/
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spelling my-inti-eprints.2212016-05-03T07:16:03Z http://eprints.intimal.edu.my/221/ Pinch current limitation effect in plasma focus Lee, S. Saw, S. H. QC Physics The Lee model couples the electrical circuit with plasma focus dynamics, thermodynamics, and radiation. It is used to design and simulate experiments. A beam-target mechanism is incorporated, resulting in realistic neutron yield scaling with pinch current and increasing its versatility for investigating all Mather-type machines. Recent runs indicate a previously unsuspected “pinch current limitation” effect. The pinch current does not increase beyond a certain value however low the static inductance is reduced to. The results indicate that decreasing the present static inductance of the PF1000 machine will neither increase the pinch current nor the neutron yield, contrary to expectations. AIP Publishing 2008 Article PeerReviewed text en http://eprints.intimal.edu.my/221/1/8.pdf Lee, S. and Saw, S. H. (2008) Pinch current limitation effect in plasma focus. Applied Physics Letters, 92 (2). ISSN 1077-3118 10.1063/1.2827579
institution INTI International University
building INTI Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider INTI International University
content_source INTI Institutional Repository
url_provider http://eprints.intimal.edu.my
language English
topic QC Physics
spellingShingle QC Physics
Lee, S.
Saw, S. H.
Pinch current limitation effect in plasma focus
description The Lee model couples the electrical circuit with plasma focus dynamics, thermodynamics, and radiation. It is used to design and simulate experiments. A beam-target mechanism is incorporated, resulting in realistic neutron yield scaling with pinch current and increasing its versatility for investigating all Mather-type machines. Recent runs indicate a previously unsuspected “pinch current limitation” effect. The pinch current does not increase beyond a certain value however low the static inductance is reduced to. The results indicate that decreasing the present static inductance of the PF1000 machine will neither increase the pinch current nor the neutron yield, contrary to expectations.
format Article
author Lee, S.
Saw, S. H.
author_facet Lee, S.
Saw, S. H.
author_sort Lee, S.
title Pinch current limitation effect in plasma focus
title_short Pinch current limitation effect in plasma focus
title_full Pinch current limitation effect in plasma focus
title_fullStr Pinch current limitation effect in plasma focus
title_full_unstemmed Pinch current limitation effect in plasma focus
title_sort pinch current limitation effect in plasma focus
publisher AIP Publishing
publishDate 2008
url http://eprints.intimal.edu.my/221/1/8.pdf
http://eprints.intimal.edu.my/221/
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score 13.211869