Pinch current limitation effect in plasma focus
The Lee model couples the electrical circuit with plasma focus dynamics, thermodynamics, and radiation. It is used to design and simulate experiments. A beam-target mechanism is incorporated, resulting in realistic neutron yield scaling with pinch current and increasing its versatility for invest...
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| Main Authors: | , |
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| 格式: | Article |
| 語言: | English |
| 出版: |
AIP Publishing
2008
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| 主題: | |
| 在線閱讀: | http://eprints.intimal.edu.my/221/1/8.pdf http://eprints.intimal.edu.my/221/ |
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| 總結: | The Lee model couples the electrical circuit with plasma focus dynamics, thermodynamics, and
radiation. It is used to design and simulate experiments. A beam-target mechanism is incorporated,
resulting in realistic neutron yield scaling with pinch current and increasing its versatility for
investigating all Mather-type machines. Recent runs indicate a previously unsuspected “pinch
current limitation” effect. The pinch current does not increase beyond a certain value however low
the static inductance is reduced to. The results indicate that decreasing the present static inductance
of the PF1000 machine will neither increase the pinch current nor the neutron yield, contrary to
expectations. |
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