Correlation of measured soft X-ray pulses with modeled dynamics of the plasma focus
The 6-phase Lee model code is used to fit the computed current waveform to the measured current waveform of INTI PF (2.2kJ at 12 kV), a T2 plasma focus device, operated as a source of neon SXR with optimum yield around 2 Torr of neon. The characteristic He-like and H-like neon line soft x-ray (...
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| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2011
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| Subjects: | |
| Online Access: | http://eprints.intimal.edu.my/146/1/5_ft.pdf http://eprints.intimal.edu.my/146/ |
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| Summary: | The 6-phase Lee model code is used to fit the
computed current waveform to the measured current waveform
of INTI PF (2.2kJ at 12 kV), a T2 plasma focus device, operated
as a source of neon SXR with optimum yield around 2 Torr of
neon. The characteristic He-like and H-like neon line soft x-ray
(SXR) pulse is measured using a pair of SXR detectors with
selected filters that by subtraction has a photon energy window of
900 to 1550eV covering the region of the characteristic neon
SXR lines. From the analysis of the fitted current and the
measured SXR pulses, the characteristic neon SXR pulses are
correlated to the pinch dynamics; and the subsequent slightly
harder SXR pulses are correlated to the anomalous resistance
phase. The characteristic neon SXR yield is measured; the pulse
has a duration of 25 ns. The characteristic neon SXR typically
starts 10 ns before the pinch phase and continues through the end
of the 10 ns pinch phase, tailing into the anomalous resistance
phase. Harder SXR pulses, probably Bremsstrahlung are
correlated to the anomalous resistance phase, with the main pulse
occurring nearly 200 ns after the characteristic neon SXR pulse. |
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