Enhancement in IEEE 1500 standard for at-speed test and debug

Enhancement in IEEE 1500 standard for at-speed test and debug

IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores...

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Bibliographic Details
Main Authors: Ali, G., Hussin, F.A., Ali, N.B.Z., Hamid, N.H., Adnan, R.M.
Format: Conference or Workshop Item
Published: Institute of Electrical and Electronics Engineers Inc. 2014
Online Access:http://scholars.utp.edu.my/id/eprint/31087/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84918573516&doi=10.1109%2fDCAS.2014.6965327&partnerID=40&md5=70c064659d44c6010b1c7b7aa6d85b2c
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http://scholars.utp.edu.my/id/eprint/31087/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84918573516&doi=10.1109%2fDCAS.2014.6965327&partnerID=40&md5=70c064659d44c6010b1c7b7aa6d85b2c

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