Enhanced Trench Shielded Power UMOSFET for Single Event Burnout Hardening

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Bibliographic Details
Main Authors:	Krishnamurthy, S., Kannan, R., Hussin, F.A., Yahya, E.A.
Format:	Conference or Workshop Item
Published:	Institute of Electrical and Electronics Engineers Inc. 2019
Online Access:	http://scholars.utp.edu.my/id/eprint/24992/ https://www.scopus.com/inward/record.uri?eid=2-s2.0-85078311992&doi=10.1109%2fRSM46715.2019.8943495&partnerID=40&md5=7c8ac635c0f811653efb271a9f089524
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