Resistivity measurement of ZnO:AI films for solar cell
Aluminium doped Zinc Oxide films were deposited on glass slide by RF magnetron sputtering using a ZnO target mixed with A120J. All the films were growth in room temperature without intentional heating. The resistivity of the ZnO:AI films were measured using van der Pauw method in terms of the prepar...
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| Main Authors: | , , , , |
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| Format: | Conference or Workshop Item |
| Language: | en |
| Published: |
2006
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| Subjects: | |
| Online Access: | http://eprints.utm.my/9302/1/TanHangKhume2006_ResistivityMeasurementofZnO.pdf http://eprints.utm.my/9302/ |
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