Electrical conductivity measurements in evaporated tin sulphide thin films
Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | en |
| Published: |
Taylor & Francis
1994
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| Subjects: | |
| Online Access: | http://eprints.utm.my/2620/1/international_jurnal_of_electronic.pdf http://eprints.utm.my/2620/ |
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