Space-Charge-Limited Dark Injection (SCL DI) transient measurements

It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection...

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Bibliographic Details

Main Authors:	Yap B.K., Koh S.P., Tiong S.K., Ong C.N.
Other Authors:	26649255900
Format:	Conference paper
Published:	2023
Subjects:	Semiconductor materials Transient analysis Bulk materials Charge-carrier mobility Dark injection Injection efficiency Mobility value Nano scale Space-charge-limited Thin layers Time-of-flight photocurrents Transient measurement Carrier mobility
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