Effects of voltage and temperature on the soft error sensitivity of CMOS memory system
The sensitivity of systems to soft errors from single event upsets have increased following the trend of downscaling circuitry. This study investigates the effect of parameter variation of voltage and temperature to the critical charge of vulnerable nodes in a 6T SRAM. A current pulse was injected i...
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| Main Authors: | , |
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| Format: | Article |
| Language: | en |
| Published: |
AIP Publishing
2025
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| Subjects: | |
| Online Access: | http://ir.unimas.my/id/eprint/50117/3/Effects%20of%20voltage.pdf http://ir.unimas.my/id/eprint/50117/ https://pubs.aip.org/aip/acp/article-abstract/3056/1/020005/3342633/Effects-of-voltage-and-temperature-on-the-soft?redirectedFrom=fulltext https://doi.org/10.1063/5.0208611 |
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