Modified SPC for short run test and measurement process in multi-stations
Due to short production runs and measurement error inherent in electronic test and measurement (T and M) processes, continuous quality monitoring through real-time statistical process control (SPC) is challenging. Industry practice allows the installation of guard band using measurement uncertainty...
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| 主要な著者: | , , |
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| フォーマット: | 論文 |
| 出版事項: |
Institute of Physics Publishing
2018
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| オンライン･アクセス: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85044523970&doi=10.1088%2f1757-899X%2f328%2f1%2f012009&partnerID=40&md5=c0f4a5323b1f5ac804315a8b6211c91d http://eprints.utp.edu.my/21705/ |
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