Face image quality inspection system according to ISO standard

• 主要作者: Ong, Paik We
• 格式: Thesis
• 語言: English
• 出版: 2012
• 主題: TK Electrical engineering. Electronics Nuclear engineering
• 在線閱讀: http://eprints.utm.my/id/eprint/32076/5/OngPaikwenMFKE2012.pdf; http://eprints.utm.my/id/eprint/32076/

Poor quality of face images is one of the reasons leading towards face recognition performance degradation. Therefore, this gives the motivation to have an International Standard (ISO/IEC 19794-5 Document) to provide guidelines for the usage of proper facial photographs for applications such as the...