Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and I-V Curves
This study presents an approach to investigate microcrack effects on the output characteristics of photovoltaic (PV) modules based on a theoretical model that is derived from the equivalent single-diode model through monitoring data and current-voltage (I-V) curves. Meanwhile, an innovative paramete...
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主要な著者: | Feng L., Zhang J., Kiong T.S., Ding K., Amin N., Hamelmann F.U. |
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その他の著者: | 57161726400 |
フォーマット: | 論文 |
出版事項: |
IEEE Electron Devices Society
2024
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