Kuan, Y. C., & cheong@eng.usm.my. (2010). Macro and nanoscopic characteristics of SiC-SiO2 interface roughness and leakage current through vacuum annealed thermally nitrided SiO2 gate on 4H-SiC. Universiti Malaysia Perlis.
Chicago Style CitationKuan, Yew Cheong, and cheong@eng.usm.my. Macro and Nanoscopic Characteristics of SiC-SiO2 Interface Roughness and Leakage Current Through Vacuum Annealed Thermally Nitrided SiO2 Gate On 4H-SiC. Universiti Malaysia Perlis, 2010.
MLA CitationKuan, Yew Cheong, and cheong@eng.usm.my. Macro and Nanoscopic Characteristics of SiC-SiO2 Interface Roughness and Leakage Current Through Vacuum Annealed Thermally Nitrided SiO2 Gate On 4H-SiC. Universiti Malaysia Perlis, 2010.
Warning: These citations may not always be 100% accurate.