Zulkifli, H., & zulhusin@unimap.edu.my. (2009). Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties. Institute of Electrical and Electronics Engineering (IEEE).
Chicago Style CitationZulkifli, Husin, and zulhusin@unimap.edu.my. Feasibility Study of a Non-destructive Fruit Maturity Testing System On Banana Utilizing Capacitive Properties. Institute of Electrical and Electronics Engineering (IEEE), 2009.
MLA CitationZulkifli, Husin, and zulhusin@unimap.edu.my. Feasibility Study of a Non-destructive Fruit Maturity Testing System On Banana Utilizing Capacitive Properties. Institute of Electrical and Electronics Engineering (IEEE), 2009.
Warning: These citations may not always be 100% accurate.