APA引文

Rahman, Z. A., & (Advisor), R. M. A. (2008). The study of the effect of MOS transistor scaling on the critical device parameters. Universiti Malaysia Perlis.

Chicago Style Citation

Rahman, Zazurina Abd, and Ramzan Mat Ayub (Advisor). The Study of the Effect of MOS Transistor Scaling On the Critical Device Parameters. Universiti Malaysia Perlis, 2008.

MLA引文

Rahman, Zazurina Abd, and Ramzan Mat Ayub (Advisor). The Study of the Effect of MOS Transistor Scaling On the Critical Device Parameters. Universiti Malaysia Perlis, 2008.

警告：這些引文格式不一定是100％准確.