Rahman, Z. A., & (Advisor), R. M. A. (2008). The study of the effect of MOS transistor scaling on the critical device parameters. Universiti Malaysia Perlis.
シカゴスタイル引用形Rahman, Zazurina Abd, and Ramzan Mat Ayub (Advisor). The Study of the Effect of MOS Transistor Scaling On the Critical Device Parameters. Universiti Malaysia Perlis, 2008.
MLA引用形式Rahman, Zazurina Abd, and Ramzan Mat Ayub (Advisor). The Study of the Effect of MOS Transistor Scaling On the Critical Device Parameters. Universiti Malaysia Perlis, 2008.
警告: この引用は必ずしも正確ではありません.