Correlation between Electronic Structure and Electron Conductivity in MoX2 X = S, Se, Te)
Layered structure molybdenum dichalcogenides, MoX2 (X = S, Se, and Te) are in focus as reversible charge storage electrode for pseudocapacitor applications. Correlation between number of layer and bandgap of the materials has been established by previous researchers. The correlation would reveal a c...
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| フォーマット: | Conference or Workshop Item |
| 言語: | English English |
| 出版事項: |
2016
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| オンライン･アクセス: | http://umpir.ump.edu.my/id/eprint/15602/1/SKM%20AMC%202016%20V2.pptx http://umpir.ump.edu.my/id/eprint/15602/2/SKM%20AMC%202016%20V2.pdf http://umpir.ump.edu.my/id/eprint/15602/ |
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