Ali, A. (2013). Compositional and structural characterization of Heterostructure InGaN-based light-emitting diode by high resolution x-ray diffraction. Trans Tech Publications, Switzerland.
シカゴスタイル引用形Ali, A.H. Compositional and Structural Characterization of Heterostructure InGaN-based Light-emitting Diode By High Resolution X-ray Diffraction. Trans Tech Publications, Switzerland, 2013.
MLA引用形式Ali, A.H. Compositional and Structural Characterization of Heterostructure InGaN-based Light-emitting Diode By High Resolution X-ray Diffraction. Trans Tech Publications, Switzerland, 2013.
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