Determination of nonlinear refractive index of large area monolayer MoS2 at telecommunication wavelength using time-resolved Z-scan technique
The nonlinear refractive index of large area monolayer molybdenum disulfide (MoS2) thin film at the 1,550 nm wavelength band is determined using time-resolved z-scan technique. MoS2 exhibits positive nonlinear phase shift with a large nonlinear refractive index, n(2) value of 1.40 x 10(-13) m(2) W-1...
保存先:
| 主要な著者: | , , , , |
|---|---|
| フォーマット: | 論文 |
| 出版事項: |
World Scientific Publishing
2024
|
| 主題: | |
| オンライン･アクセス: | http://eprints.um.edu.my/46056/ https://doi.org/10.1142/S0218863523500522 |
| タグ: |
タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
|
| 要約: | The nonlinear refractive index of large area monolayer molybdenum disulfide (MoS2) thin film at the 1,550 nm wavelength band is determined using time-resolved z-scan technique. MoS2 exhibits positive nonlinear phase shift with a large nonlinear refractive index, n(2) value of 1.40 x 10(-13) m(2) W-1. The obtained value is similar to the n(2) value of monolayer MoS2 film measured at 2.0 mu m, and is approximately five and seven orders of magnitude larger than silicon and common bulk dielectrics. The large n(2) indicates that MoS2 can be used as nonlinear refractive 2D material for photonics applications operating in the 1,550 nm optical telecommunications wavelength band. |
|---|