Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator
The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both fo...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Trans Tech Publications Ltd., Switzerland
2011
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/8575/1/AGUS_-_Applied_Mechanics_and_Materials_2011_-_Nanoeducator.pdf http://irep.iium.edu.my/8575/ http://www.scientific.net/AMM.84-85.392 |
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