Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator

• المؤلفون الرئيسيون: Edy Sutjipto, Agus Geter, Faris, Waleed Fekry, Adesta, Erry Yulian Triblas, Hanim, Hafizah
• التنسيق: مقال
• اللغة: English
• منشور في: Trans Tech Publications Ltd., Switzerland 2011
• الموضوعات: TA401 Materials of engineering and construction
• الوصول للمادة أونلاين: http://irep.iium.edu.my/8575/1/AGUS_-_Applied_Mechanics_and_Materials_2011_-_Nanoeducator.pdf; http://irep.iium.edu.my/8575/; http://www.scientific.net/AMM.84-85.392

The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both fo...