Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator

The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both fo...

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Main Authors: Edy Sutjipto, Agus Geter, Faris, Waleed Fekry, Adesta, Erry Yulian Triblas, Hanim, Hafizah
格式: Article
语言:English
出版: Trans Tech Publications Ltd., Switzerland 2011
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在线阅读:http://irep.iium.edu.my/8575/1/AGUS_-_Applied_Mechanics_and_Materials_2011_-_Nanoeducator.pdf
http://irep.iium.edu.my/8575/
http://www.scientific.net/AMM.84-85.392
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