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    Deterministic Automatic Test Pattern Generation for Built-In Self Test System

    Deterministic Automatic Test Pattern Generation for Built-In Self Test System by Mohammed Khalid, Muhammad Nazir

    Published 2006
    “…To illustrate that, the DATPG algorithm for digital combinational circuit using VHDL language is designed to generate the test patterns. …”
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    Digital Signal Processor (DSP) Design Using Very Long Instruction Word (VLIW) Architecture

    Digital Signal Processor (DSP) Design Using Very Long Instruction Word (VLIW) Architecture by Lee, Lini @ Lini Lee

    Published 2001
    “…Based on the verification done on Programmable Logic Device (PLO) of MAX 7000s family, the operation can be executed in 40 MIPS (Million instructions per second). …”
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