Search Results - parallel generation ((gap algorithm) OR (max algorithm))*

Deterministic Automatic Test Pattern Generation for Built-In Self Test System by Mohammed Khalid, Muhammad Nazir

“…To illustrate that, the DATPG algorithm for digital combinational circuit using VHDL language is designed to generate the test patterns. …”
Get full text
Get full text

A test case generation framework based on UML statechart diagram by Salman, Yasir Dawood

“…Unfortunately, existing studies in this domain are not sufficiently comprehensive in describing the major processes of the automated test case generation. Furthermore, the algorithms used for test case generation are not provided or well described. …”
Get full text
Get full text
Get full text
Get full text

Twofold Integer Programming Model for Improving Rough Set Classification Accuracy in Data Mining. by Saeed, Walid

“…Total rules number, rules length and rules accuracy for the generation rules are recorded. The accuracy for rules and classification resulted from the TIP method are compared with other methods such as Standard Integer Programming (SIP) and Decision Related Integer Programming (DRIP) from Rough Set, Genetic Algorithm (GA), Johnson reducer, HoltelR method, Multiple Regression (MR), Neural Network (NN), Induction of Decision Tree Algorithm (ID3) and Base Learning Algorithm (C4.5); all other classifiers that are mostly used in the classification tasks. …”
Get full text
Get full text

Digital Signal Processor (DSP) Design Using Very Long Instruction Word (VLIW) Architecture by Lee, Lini @ Lini Lee

“…Based on the verification done on Programmable Logic Device (PLO) of MAX 7000s family, the operation can be executed in 40 MIPS (Million instructions per second). …”
Get full text
Get full text