Search Results - (( using function path algorithm ) OR ( defect classification methods algorithm ))

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  1. 1

    Software defect prediction framework based on hybrid metaheuristic optimization methods by Wahono, Romi Satria

    Published 2015
    “…The classification algorithm is a popular machine learning approach for software defect prediction. …”
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    Thesis
  2. 2

    Evaluation of the Transfer Learning Models in Wafer Defects Classification by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen

    Published 2022
    “…The key metrics for the evaluation are classification accuracy, classification precision and classification recall. 855 images were used to train and test the algorithms. …”
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    Conference or Workshop Item
  3. 3
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    Cross-project software defect prediction by Bala, Yahaya Zakariyau, Abdul Samat, Pathiah, Sharif, Khaironi Yatim, Manshor, Noridayu

    Published 2022
    “…In this work, five research questions covering the classification algorithms, dataset, independent variables, performance evaluation metrics used in CPDP studies, and as well as the performance of individual machine learning classification algorithms in predicting software defects across different software projects were addressed accordingly. …”
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    Article
  5. 5

    Partial discharge classification for XLPE cable joints using K nearest neighbors algorithm / Muhammad Shairazi Mohd Salleh by Muhammad Shairazi , Mohd Salleh

    Published 2020
    “…The input data from the PD measurement results were used to train k-nearest neighbor (KNN) algorithm to classify each type of defect in the cable joint samples. …”
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    Thesis
  6. 6

    A-star (A*) algorithm implementation for robotics path planning navigation by Emirul Ridzwan, Nor Azmi

    Published 2018
    “…This thesis is about the implementation of Astar (A*) algorithm as path planning algorithm used in robotics navigation. …”
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    Undergraduates Project Papers
  7. 7

    Synthesis of transistor chaining algorithm for CMOS cell layout using euler path / Sukri Hanafiah by Hanafiah, Sukri

    Published 1997
    “…The euler's path it using pseudo input and Heuristic algorithm to find the minimum interlace. …”
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    Thesis
  8. 8

    Machine learning application for concrete surface defects automatic damage classification by Syahrul Fithry Senin, Khairullah Yusuf, Amer Yusuf, Rohamezan Rohim

    Published 2024
    “…Therefore, a Machine Learning classifier for concrete surface defect classification using the Discriminant Analysis Classifier was introduced to more accurately extract the types of concrete surface defects information from the digital images. …”
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    Article
  9. 9

    Enhanced Image Classification for Defect Detection on Solar Photovoltaic Modules by Wiliani, Ninuk

    Published 2023
    “…However, high similarity of characteristics among the shapes and textures has been a major challenge in defect classification process. The objective of this research was to develop and analyse feature extraction used for classification techniques for defect detection of solar photovoltaic modules surfaces. …”
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  10. 10

    A cascading fuzzy logic with image processing algorithm-based defect detection for automatic visual inspection of industrial cylindrical object’s surface by Ali, Mohammed A. H., Au, Kai Lun

    Published 2018
    “…This paper proposes a cascading fuzzy logic algorithm with image processing technique for defect detection and classification on the lateral surface of industrial cylindrical object using a camera and multiple flat mirrors. …”
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    Article
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    Hybrid path planning for indoor robot with Laplacian Behaviour-based control via four point-explicit group by Azali Saudi, Jumat Sulaiman

    Published 2014
    “…Consequently, the gradient of the potential functions would be used by the searching algorithm to generate path from starting to goal location. …”
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    Article
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    Internal defect detection and reconstruction framework for laminated glass fibre reinforced polymer composite materials by Ng, Sok Choo

    Published 2013
    “…(iii) The image ofthe defect region is reconstructed by using the attenuation of the reflected ultrasound signal (iv) Entropy-based fuzzy k-nearest neighbour classification method is used to extract the feature of the defects. …”
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    Thesis
  16. 16

    False path identification algorithm framework for nonseparable controller-data path circuits by Shaheen, Ateeq U. R., Hussin, Fawnizu Azmadi, Hamid, Nor Hisham

    Published 2016
    “…This paper proposes an algorithm frame-work to deal with these false paths through identification for DFT test. …”
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    Conference or Workshop Item
  17. 17

    Identifying Damage Types in Solar Panels Through Surface Image Analysis with Naive Bayes by Wiliani, Ninuk, T.K.A, Rahman, Ramli, Suzaimah

    Published 2024
    “…This study investigates the utilization of statistical feature extraction methods alongside Bernoulli Naive Bayes (BNB) and Gaussian Naive Bayes (GNB) algorithms to categorize different defect types, such as cracks, scratches, spots, and non-defective surfaces, through digital image analysis. …”
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    Journal
  18. 18

    Defect Detection And Classification Of Silicon Solar Wafer Featuring Nir Imaging And Improved Niblack Segmentation by Mahdavipour, Zeinab

    Published 2016
    “…The classification combines the analysis of defect intensity features, the application of unsupervised k-mean clustering and multi-class SVM algorithms. …”
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    Thesis
  19. 19

    Nlfxlms and thf-nlfxlms algorithms for wiener-hammerstein nonlinear active noise control by Srazhidinov, Radik

    Published 2016
    “…However, this assumption may lead to inaccurate secondary path model. In this work, the modelling of acoustic path using FIR filters is incorporated for both algorithms for Wiener-Hammerstein structure. …”
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    Thesis
  20. 20

    False path identification algorithm framework for nonseparable controller-data path circuits by Shaheen, A.-U.-R., Hussin, F.A., Hamid, N.H.

    Published 2017
    “…This paper proposes an algorithm framework to deal with these false paths through identification for DFT test. …”
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    Article