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Defect Detection And Classification Of Silicon Solar Wafer Featuring Nir Imaging And Improved Niblack Segmentation by Mahdavipour, Zeinab

Published 2016
“…Keputusan emperikal dan visual menunjukkan ketepatan dan prestasi yang lebih baik dari segi angka merit Pratt dan kaedah penilaian yang lain berbanding dengan formula pengambangan Niblack yang sedia ada. …”

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