Search Results - (( developing memory detection algorithm ) OR ( java optimization based algorithm ))
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Development of automated neighborhood pattern sensitive faults syndrome generator for static random access memory
Published 2011“…Moreover, most of the memory test algorithm does not have the capability to detect and diagnose NPSF. …”
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Analysis of disturb coupling faults coverage by the March AZ2 algorithm in memory BIST
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A fault syndromes simulator for random access memories
Published 2008“…Due to this, a systematic approach for developing and evaluating memory test algorithm is required. …”
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March-based diagnosis algorithm for static random-access memory stuck-at faults and transition faults
Published 2012“…This factor contributes to challenges faced in the area of memory testing. Functional test is a standard testing procedure to determine the functionality of the memory by performing a sequence of read write operations to detect faults. …”
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An efficient fault syndromes simulator for SRAM memories
Published 2009“…Due to this, a systematic approach for developing and evaluating memory test algorithm is required. …”
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Multiple and solid data background scheme for testing static single cell faults on SRAM memories
Published 2013“…Memory testing is a method that requires an algorithm capable of detecting faulty memory as comprehensively as possible to facilitate the efficient manufacture of fault free memory products. …”
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Optimization of blood vessel detection in retina images using multithreading and native code for portable devices
Published 2013“…The optimization of a computationally intensive algorithm such as this on a mobile platform is challenging due to the limited resources available. …”
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Generation of new low-complexity March algorithms for optimum faults detection in SRAM
Published 2023“…A high-complexity test algorithm like the March MSS (18N) can guarantee the detection of all unlinked static faults in SRAM. …”
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Reduced Galloping Column Algorithm For Memory Testing
Published 2015“…There are lots of memory algorithms used for memory testing, including the galloping column algorithm (GalCol). …”
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10
Automatic Number Plate Recognition on android platform: With some Java code excerpts
Published 2016“…Hence, the objective of this research is to propose suitable and optimize algorithm for ANPR system on Android mobile phone. …”
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Attribute reduction based scheduling algorithm with enhanced hybrid genetic algorithm and particle swarm optimization for optimal device selection
Published 2022“…Therefore, in this paper, we proposed Dynamic tasks scheduling algorithm based on attribute reduction with an enhanced hybrid Genetic Algorithm and Particle Swarm Optimization for optimal device selection. …”
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Testing static single cell faults using static and dynamic data background
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Optimizing Ram Testing Method For Test Time Saving Using Automatic Test Equipment
Published 2017“…A memory Build-in Self-test (BIST) design with capability of algorithm failing sequence capture have been developed to implement in the Automate Test Equipment (ATE) flow for production screen. 3 selected algorithm have been tested on the 8 detect units in ATE flow to prove the concept of this method. …”
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Detecting JFIF header using FORHEADER
Published 2011“…Header and footer are important in digital investigation for JPEG file detection as only 16% of files are fragmented. The use of efficient algorithm to detect them is vital to reduce time taken for analyzing ever increasing data in hard drive or physical memory. …”
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Hyper-heuristic approaches for data stream-based iIntrusion detection in the Internet of Things
Published 2022“…The experimental results showed that the accuracy of the algorithm over the NSL-KDD dataset was 99.72%, with a memory reduction of 10%. …”
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Ant colony optimization algorithm for load balancing in grid computing
Published 2012“…The proposed algorithm is known as the enhance ant colony optimization (EACO). …”
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MBIST implementation and evaluation in FPGA based on low-complexity March algorithms
Published 2024“…March algorithms are widely used in Memory Built-In Self-Test (MBIST) on-chip memory testing, providing linear test complexities that reduce the test time and cost. …”
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Embedded vision system development using 32-bit Single Board Computer and GNU/Linux
Published 2011“…The increasing affordability of powerful processors and memory chips, availability of real-time operating systems, low complexity intelligent algorithms and the coming-of-age of system development software are the key factor that makes this development possible. …”
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