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Transient electromagnetic-thermal nondestructive testing by He, Yunze, Gao, Bin, Sophian, Ali, Yang, Ruizhen

Published 2017
“…In addition, the book explores methods, such as time domain, frequency domain and logarithm domain, also comparing A-scan , B-scan and C-scan. Sections on defect identification, classification and quantification are covered, as are advanced algorithms, principal components analysis (PCA), independent components analysis (ICA) and support vector machine (SVM). …”

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