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Defect Detection And Classification Of Silicon Solar Wafer Featuring Nir Imaging And Improved Niblack Segmentation by Mahdavipour, Zeinab

“…The classification combines the analysis of defect intensity features, the application of unsupervised k-mean clustering and multi-class SVM algorithms. The methods have been applied for detecting, clustering and classification polycrystalline solar wafer images, corresponding to defects such as micro cracks, stain, and fingerprints. …”
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Bottleneck-based heuristic for permutation flowshop scheduling by Isa, Noor Amira

“…There are four potential dominant machines (M1, M2, M3, M4) clustered as bottleneck machines. A total 1000 set random processing time for each job sizes was tested using Excel simple programming with built in Visual Basic for Application (VBA). …”
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Discriminative feature representation for Malay children’s speech recognition / Seyedmostafa Mirhassani by Mirhassani, Seyedmostafa

“…In the next step, based on the cepstral features provided by the filterbanks a hierarchical phoneme classification is performed. Systems using the provided features were evaluated in phoneme recognition/classification task. …”
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