Mechanism-based reliability model for electronic packages
Mechanism-based reliability model is different from the conventional reliability model. It is generated based on a specific failure. The failure mechanism is studied in detail to obtain a model that incorporates all significant stressing variables. For fatigue driven failure, Coffin-Manson equation...
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| Main Author: | |
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| Format: | Thesis |
| Language: | en |
| Published: |
2005
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| Online Access: | http://eprints.utm.my/4369/1/NgCheeWengMFKM2005.pdf http://eprints.utm.my/4369/ |
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