Detecting Resistive-Opens in RRAM using Programmable DfT Scheme

Resistive Random Access Memory (RRAM) is one of the emerging memory devices that possesses a combined attribute of SRAM, DRAM and flash. How- ever, as the technology and fabrication process of such a promising memory devices are still immature, RRAM is expected to be impacted by process-variati...

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Bibliographic Details

Main Authors:	Nor Zaidi , Haron, Norsuhaidah , Arshad, Sukreen Hana , Herman
Format:	Conference or Workshop Item
Language:	en
Published:	2013
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utem.edu.my/id/eprint/10106/1/ASQED13.pdf http://eprints.utem.edu.my/id/eprint/10106/
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