APA (7th ed.) Citation

H.A, E., B.Y, M., I, A., T, Z., & 36536722700. (2023). Characterization of fabrication process noises for 32nm NMOS devices.

Chicago Style (17th ed.) Citation

H.A, Elgomati, Majlis B.Y, Ahmad I, Ziad T, and 36536722700. Characterization of Fabrication Process Noises for 32nm NMOS Devices. 2023.

MLA (9th ed.) Citation

H.A, Elgomati, et al. Characterization of Fabrication Process Noises for 32nm NMOS Devices. 2023.