APA (7th ed.) Citation

H.A, E., B.Y, M., I, A., F, S., F.A, H., A, Z., . . . 36536722700. (2023). Statistical optimization for process parameters to reduce variability of 32 nm PMOS transistor threshold voltage.

Chicago Style (17th ed.) Citation

H.A, Elgomati, Majlis B.Y, Ahmad I, Salehuddin F, Hamid F.A, Zaharim A, Mohamad T.Z, Apte P.R, and 36536722700. Statistical Optimization for Process Parameters to Reduce Variability of 32 Nm PMOS Transistor Threshold Voltage. 2023.

MLA (9th ed.) Citation

H.A, Elgomati, et al. Statistical Optimization for Process Parameters to Reduce Variability of 32 Nm PMOS Transistor Threshold Voltage. 2023.