S, M., M.M, H., K, S., V, S., M.S, J., M.S, B., . . . 57217200870. (2023). Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications. MDPI.
Chicago Style (17th ed.) CitationS, Mahjabin, et al. Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications. MDPI, 2023.
MLA (9th ed.) CitationS, Mahjabin, et al. Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications. MDPI, 2023.
Warning: These citations may not always be 100% accurate.