A comparative study of CdS thin films grown on ultra-thin glass substrates by RF magnetron sputtering and chemical bath deposition

Atomic force microscopy; Cadmium sulfide; Chemical analysis; Energy gap; Field emission microscopes; Glass; Hall effect; II-VI semiconductors; Magnetron sputtering; Scanning electron microscopy; Substrates; X ray diffraction; Zinc sulfide; Atomic-force-microscopy; Cadmium sulphide thin films; Chemic...

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Bibliographic Details

Main Authors:	Doroody C., Rahman K.S., Rosly H.N., Harif M.N., Isah M., Kar Y.B., Tiong S.K., Amin N.
Other Authors:	56905467200
Format:	Article
Published:	Elsevier Ltd 2023
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