APA (7th ed.) Citation

K.E, K., F, S., N, S., A.S.M, Z., M.N.I.A, A., I, A., & 56472706900. (2023). Electrical characterization of different high-k dielectrics with tungsten silicide in vertical double gate nmos structure. Asian Research Publishing Network.

Chicago Style (17th ed.) Citation

K.E, Kaharudin, Salehuddin F, Soin N, Zain A.S.M, Aziz M.N.I.A, Ahmad I, and 56472706900. Electrical Characterization of Different High-k Dielectrics with Tungsten Silicide in Vertical Double Gate Nmos Structure. Asian Research Publishing Network, 2023.

MLA (9th ed.) Citation

K.E, Kaharudin, et al. Electrical Characterization of Different High-k Dielectrics with Tungsten Silicide in Vertical Double Gate Nmos Structure. Asian Research Publishing Network, 2023.