Defects identification on semiconductor wafer for yield improvement using machine learning / Pedram Tabatabaeemoshiri

The semiconductor industry underpins modern technology, with its products embedded in almost every electronic device. As semiconductor devices grow increasingly intricate, ensuring their quality and reliability becomes more challenging. Electrical testing is crucial to semiconductor wafer quality...

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Bibliographic Details

Main Author:	Pedram , Tabatabaeemoshiri
Format:	Thesis
Published:	2025
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://studentsrepo.um.edu.my/16000/1/Pedram_Tabatabaeemoshiri.pdf http://studentsrepo.um.edu.my/16000/2/Pedram_Tabatabaeemoshiri.pdf http://studentsrepo.um.edu.my/16000/
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