Pedram , T. (2025). Defects identification on semiconductor wafer for yield improvement using machine learning / Pedram Tabatabaeemoshiri.
Chicago Style (17th ed.) CitationPedram , Tabatabaeemoshiri. Defects Identification on Semiconductor Wafer for Yield Improvement Using Machine Learning / Pedram Tabatabaeemoshiri. 2025.
MLA (9th ed.) CitationPedram , Tabatabaeemoshiri. Defects Identification on Semiconductor Wafer for Yield Improvement Using Machine Learning / Pedram Tabatabaeemoshiri. 2025.
Warning: These citations may not always be 100% accurate.