Search Results - Shaheen, A.-U.-R.
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Automatic generation of test instructions for path delay faults based-on stuck-at fault in processor cores using assignment decision diagram by Shaheen, A.-U.-R., Hussin, F.A., Hamid, N.H., Ali, N.B.Z.
Published 2014Get full text
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Delay design-for-testability for functional RTL circuits by Shaheen, A.-U.-R., Hussin, F.A., Hamid, N.H.
Published 2015Get full text
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Delay design-for-testability for functional RTL circuits by Shaheen, A.-U.-R., Hussin, F.A., Hamid, N.H.
Published 2015Get full text
Get full text
Conference or Workshop Item
