Search Results - Sayed N.M.

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    Threshold voltage and leakage current variability on process parameter in a 22nm PMOS Device

    Threshold voltage and leakage current variability on process parameter in a 22nm PMOS Device by Afifah Maheran A.H., Menon P.S., Ahmad I., Noor Faizah Z.A., Mohd Zain A.S., Salehuddin F., Sayed N.M.

    Published 2023
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